Scanning Electron Microscopy and X-ray Microanalysis合并版本
Joseph I. Goldstein
University of Massachusetts
Amherst, Massachusetts
Dale E. Newbury
National Institute of Standards and
Technology
Gaithersburg, Maryland
Patrick Echlin
Cambridge Analytical Microscopy Ltd.
Cambridge, England
David C. Joy
University of Tennessee
Knoxville, Tennessee
Charles E. Lyman
Lehigh University
Bethlehem, Pennsylvania
Eric Lifshin
State University at Albany
Albany, New York
Linda Sawyer
Ticona LLC
Summit, New Jersey
Joseph R. Michael
Sandia National Laboratories
Albuquerque, New Mexico
8llx|7[/pan]
