有关原子力温度控制热台的文献
Temperature controlled microstage for an atomic force microscope
I. Mus˘evic˘, G. Slak, and R. Blinc
J. Stefan Institute, Jamova 39, 61 000 Ljubljana, Slovenia
~Received 6 February 1996; accepted for publication 21 March 1996!
A temperature controlled microstage has been developed for an atomic force microscope ~AFM!.
The stage is based on a small, temperature regulated heater, which is attached to the piezo-scanner
of the AFM. The operating performances of the AFM have been tested in air at elevated
temperatures. It was found that atomic resolution can routinely be achieved up to 80 °C, whereas
beyond this temperature, the onset of thermal instabilities of the AFM cantilever was observed.
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